메뉴 건너뛰기




Volumn , Issue , 2003, Pages 300-312

An experimental assessment of compact thermal models for the prediction of board-mounted electronic component heat transfer

Author keywords

Benchmark; CFD; Compact thermal models; Component modeling; PQFP; Printed circuit board; SO

Indexed keywords

COMPUTATIONAL FLUID DYNAMICS; ELECTRIC NETWORK ANALYSIS; HEAT TRANSFER; PRINTED CIRCUIT BOARDS; SEMICONDUCTOR DEVICE TESTING; STATISTICAL METHODS; TEMPERATURE MEASUREMENT; THERMOGRAPHY (IMAGING); AMPHIBIOUS VEHICLES; ATMOSPHERIC TEMPERATURE; CHIP SCALE PACKAGES; CRASHWORTHINESS; ELECTRONICS PACKAGING; FLUID DYNAMICS; PRINTED CIRCUITS; SEMICONDUCTOR DEVICE MODELS; SEMICONDUCTOR DEVICES; SEMICONDUCTOR JUNCTIONS; THERMAL VARIABLES MEASUREMENT; THERMOGRAPHY (TEMPERATURE MEASUREMENT);

EID: 0037277871     PISSN: 10652221     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (11)

References (33)
  • 1
    • 0031334642 scopus 로고    scopus 로고
    • The world of thermal characterization according to DELPHI-Parts I and II: Experimental and numerical methods
    • Lasance, C.J.M., Rosten, H., and Parry, J., "The World of Thermal Characterization According to DELPHI-Parts I and II: Experimental and Numerical Methods", IEEE Trans. on Components, Packaging & Mfg. Technology, Part A, Vol. 20, No. 4, pp. 392-398, 1997.
    • (1997) IEEE Trans. on Components, Packaging & Mfg. Technology, Part A , vol.20 , Issue.4 , pp. 392-398
    • Lasance, C.J.M.1    Rosten, H.2    Parry, J.3
  • 4
    • 0035691804 scopus 로고    scopus 로고
    • Two benchmarks to facilitate the study of compact thermal modeling phenomena
    • Lasance, C.J.M, "Two Benchmarks to Facilitate the Study of Compact Thermal Modeling Phenomena," IEEE Trans on Components and Packaging Technology (CPT), Vol. 24, pp.559-566, 2000.
    • (2000) IEEE Trans on Components and Packaging Technology (CPT) , vol.24 , pp. 559-566
    • Lasance, C.J.M.1
  • 10
    • 0032025118 scopus 로고    scopus 로고
    • The development of component-level thermal compact models of a C4/CBGA interconnect technology: The motorola PowerPC 603 and PowerPC604 RICS microprocessors
    • Parry, J., Rosten, H., and Kromann, G. B., The Development of Component-Level Thermal Compact Models of a C4/CBGA Interconnect Technology: The Motorola PowerPC 603 and PowerPC604 RICS Microprocessors, III Trans on Components, Packaging & Mfg Technology - Part A, Vol. 21, No. 1, 1998.
    • (1998) III Trans on Components, Packaging & Mfg Technology - Part A , vol.21 , Issue.1
    • Parry, J.1    Rosten, H.2    Kromann, G.B.3
  • 14
    • 0035365361 scopus 로고    scopus 로고
    • A study of compact thermal model topologies in CFD for a flip chip ball grid array package
    • Shidore, S., Adams, V., and Lee, T.-Y. T. "A Study of Compact Thermal Model Topologies in CFD for a Flip Chip Ball Grid Array Package," IEEE Trans on Components and Packaging Technology (CPT) Vol. 24, No. 2, pp. 191-198, 2001.
    • (2001) IEEE Trans on Components and Packaging Technology (CPT) , vol.24 , Issue.2 , pp. 191-198
    • Shidore, S.1    Adams, V.2    Lee, T.-Y.T.3
  • 17
    • 0004059365 scopus 로고    scopus 로고
    • An experimental assessment of numerical predictive accuracy for electronic component heat transfer
    • Ph.D. Thesis, University of Limerick, Ireland
    • Rodgers, P., "An Experimental Assessment of Numerical Predictive Accuracy for Electronic Component Heat Transfer", Ph.D. Thesis, University of Limerick, Ireland, 2000.
    • (2000)
    • Rodgers, P.1
  • 18
    • 0034272347 scopus 로고    scopus 로고
    • A benchmark study of computational fluid dynamics predictive accuracy for component-printed circuit board heat transfer
    • Eveloy, V., Lohan, J., and Rodgers, R., "A Benchmark Study of Computational Fluid Dynamics Predictive Accuracy for Component-Printed Circuit Board Heat Transfer," IEEE Trans on Components and Packaging Technology (CPT), Volume 23, Number 3, pp. 568-577, 2000.
    • (2000) IEEE Trans on Components and Packaging Technology (CPT) , vol.23 , Issue.3 , pp. 568-577
    • Eveloy, V.1    Lohan, J.2    Rodgers, R.3
  • 19
    • 0003309881 scopus 로고    scopus 로고
    • An experimental assessment of numerical predictive accuracy for electronic component heat transfer in forced convection: Parts I and II
    • Rodgers, P., Eveloy, V., and Davies, M., "An Experimental Assessment of Numerical Predictive Accuracy for Electronic Component Heat Transfer in Forced Convection: Parts I and II," Trans of the ASME, Journal of Electronic Packaging, Vol. 125, No. 1, 2003.
    • (2003) Trans of the ASME, Journal of Electronic Packaging , vol.125 , Issue.1
    • Rodgers, P.1    Eveloy, V.2    Davies, M.3
  • 21
    • 0034272295 scopus 로고    scopus 로고
    • Experimental and numerical investigation into the influence of printed circuit board construction on component operating temperature in natural convection
    • Lohan, J., Tiilikka, P., Rodgers, P., Fager, C.M., and Rantala, J., "Experimental and Numerical Investigation into the Influence of Printed Circuit Board Construction on Component Operating Temperature in Natural Convection," IEEE Trans on Components and Packaging Technology (CPT), Volume 23, Number 3, pp. 578-586, 2000.
    • (2000) IEEE Trans on Components and Packaging Technology (CPT) , vol.23 , Issue.3 , pp. 578-586
    • Lohan, J.1    Tiilikka, P.2    Rodgers, P.3    Fager, C.M.4    Rantala, J.5
  • 23
    • 0004297781 scopus 로고
    • Guide line for unencapsulated thermal test chip
    • SEMI G32-94; Semi International Standards, Packaging
    • SEMI G32-94, "Guide Line for Unencapsulated Thermal test Chip," Semi International Standards, Packaging Volume, 1994.
    • (1994)
  • 24
    • 0003713944 scopus 로고    scopus 로고
    • Low effective thermal conductivity test board for leaded surface mount components
    • EIA/JESD51-3; Electronic Industries Association, Engineering Department, 2500 Wilson Boulevard, Arlington, VA 22201-3834, USA
    • EIA/JESD51-3, "Low Effective Thermal Conductivity Test Board for Leaded Surface Mount Components", Electronic Industries Association, Engineering Department, 2500 Wilson Boulevard, Arlington, VA 22201-3834, USA, 1996.
    • (1996)
  • 25
    • 0003713943 scopus 로고    scopus 로고
    • High effective thermal conductivity test board for leaded surface mount components
    • EIA/JESD51-7; Electronic Industries Association, Engineering Department, 2500 Wilson Boulevard, Arlington, VA 22201-3834, USA
    • EIA/JESD51-7, "High Effective Thermal Conductivity Test Board for Leaded Surface Mount Components", Electronic Industries Association, Engineering Department, 2500 Wilson Boulevard, Arlington, VA 22201-3834, USA, 1999.
    • (1999)
  • 26
    • 0004192832 scopus 로고
    • Integrated circuits thermal test method environmental conditions - Natural convection (Still-Air)
    • EIA/JESD51-2; Electronic Industries Association, Engineering Department, 2500 Wilson Boulevard, Arlington, VA 22201-3834, USA
    • EIA/JESD51-2, "Integrated Circuits Thermal Test Method Environmental Conditions - Natural Convection (Still-Air)", Electronic Industries Association, Engineering Department, 2500 Wilson Boulevard, Arlington, VA 22201-3834, USA 1995.
    • (1995)
  • 27
    • 0004192831 scopus 로고    scopus 로고
    • Integrated circuits thermal test method environmental conditions - Forced convection (Moving Air)
    • EIA/JESD51-6; Electronic Industries Association, Engineering Department, 2500 Wilson Boulevard, Arlington, VA 22201-3834, USA
    • EIA/JESD51-6, "Integrated Circuits Thermal Test Method Environmental Conditions - Forced Convection (Moving Air)", Electronic Industries Association, Engineering Department, 2500 Wilson Boulevard, Arlington, VA 22201-3834, USA, 1999.
    • (1999)
  • 28
    • 0013243431 scopus 로고    scopus 로고
    • Test method for still- and forced air junction-to-ambient thermal resistance measurements of integrated circuits
    • SEMI G38-0996; SEMI International Standards, Packaging Volume
    • SEMI G38-0996, "Test Method for Still- and Forced Air Junction-to-Ambient Thermal Resistance Measurements of Integrated Circuits," SEMI International Standards, Packaging Volume, 1996.
    • (1996)
  • 29
    • 0013284265 scopus 로고    scopus 로고
    • Flomerics Limited, Bridge Road, Hampton Court, Surrey, KT8 9HH, United Kingdom
    • Flotherm, 2001, Version 3.2 Reference and User Manuals, Flomerics Limited, Bridge Road, Hampton Court, Surrey, KT8 9HH, United Kingdom, 2001.
    • (2001) Flotherm, 2001, Version 3.2 Reference and User Manuals
  • 32
    • 0343917019 scopus 로고    scopus 로고
    • Thermal characterization of electronic devices by means of improved boundary condition independent compact models
    • Editors Beyne, Lasance and Berghmans, Kluwer Academic Publishers
    • Vinke, H., and Lasance, C. J.M., "Thermal Characterization of Electronic Devices by Means of Improved Boundary Condition Independent Compact Models, In Thermal Management of Electronic Systems II, Editors Beyne, Lasance and Berghmans, Kluwer Academic Publishers, pp. 115-124, 1997.
    • (1997) Thermal Management of Electronic Systems II , pp. 115-124
    • Vinke, H.1    Lasance, C.J.M.2
  • 33
    • 1242350953 scopus 로고    scopus 로고
    • Thermal conductivity measurements in printed wiring boards
    • Graebner, J. E., and Azar, K, "Thermal Conductivity Measurements in Printed Wiring Boards," Trans of the ASME, Journal of Heat Transfer, Vol. 119, No. 3, pp. 401-405, 1997.
    • (1997) Trans of the ASME, Journal of Heat Transfer , vol.119 , Issue.3 , pp. 401-405
    • Graebner, J.E.1    Azar, K.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.