Determination of 3D atomic structure of surfaces and interfaces by photoelectron holography

Surface and Interface Analysis

Volumn 35, Issue 1, 2003, Pages 45-50

  Nihei, Yoshimasa ^a  

^a TOKYO UNIVERSITY OF SCIENCE   (Japan)

Author keywords

3D atomic structure determination; Differential photoelectron holography; Photoelectron diffraction; Photoelectron holography; Surface characterization; XPD XPED; XPS

Indexed keywords

ELECTRON DIFFRACTION; ELECTRON SPECTROSCOPY; HOLOGRAPHY; INTERFACES (MATERIALS); SURFACES; X RAYS;

HIGH ANGLE RESOLVING ANALYSER; MULTI ENERGY HIGH POWER X RAY SOURCE; PHOTOELECTRON DIFFRACTION; PHOTOELECTRON HOLOGRAPHY; THREE DIMENSIONAL ATOMIC STRUCTURE; X RAY SOURCE;

CRYSTAL ATOMIC STRUCTURE;

EID: 0037262318     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/sia.1491     Document Type: Article

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