Measurements of X-ray photoelectron diffraction using high angular resolution and high transmission electron energy analyzer

Surface Science

Volumn 493, Issue 1-3, 2001, Pages 29-35

  Shiraki, S ^a   Ishii, H ^a   Amano, M ^a   Nihei, Y ^a   Owari, M ^b   Oshima, C ^c   Koshikawa, T ^d   Shimizu, R ^e  

^a INSTITUTE OF INDUSTRIAL SCIENCE   (Japan)

^b UNIVERSITY OF TOKYO   (Japan)

^c WASEDA UNIVERSITY   (Japan)

^d OSAKA ELECTRO COMMUNICATION UNIVERSITY   (Japan)

^e OSAKA INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

Angle resolved photoemission; Halides; Photoelectron diffraction

Indexed keywords

ELECTRON ENERGY ANALYZERS; PHOTOEMISSION; X RAY DIFFRACTION ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

PHOTOELECTRON DIFFRACTION;

ELECTRON DIFFRACTION;

EID: 0035500848     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(01)01185-2     Document Type: Conference Paper

References (16)