X-ray photoelectron diffraction study of discommensurate Cu/Ge(1 1 1)

Surface Science

Volumn 440, Issue 3, 1999, Pages

  Suzuki, T ^a,b   Omori, S ^a   Nihei, Y ^a  

^a INSTITUTE OF INDUSTRIAL SCIENCE   (Japan)

^b MITSUBISHI CHEMICAL CORPORATION   (Japan)

Author keywords

Copper; Electron solid interactions, scattering, diffraction; Germanium; Low index single crystal surfaces; Metal semiconductor interfaces; Photoelectron diffraction; Surface relaxation and reconstruction

Indexed keywords

COPPER; CRYSTAL ATOMIC STRUCTURE; CRYSTAL ORIENTATION; ELECTRON DIFFRACTION; ELECTRON EMISSION; ELECTRON SCATTERING; RELAXATION PROCESSES; SEMICONDUCTING GERMANIUM; SINGLE CRYSTALS; SURFACE STRUCTURE; X RAY PHOTOELECTRON SPECTROSCOPY;

LOW-INDEX SINGLE CRYSTALS; SURFACE RECONSTRUCTION;

SEMICONDUCTOR METAL BOUNDARIES;

EID: 0033359980     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(99)00868-7     Document Type: Article

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