Surface structure of defected CaF2(111) layers studied by scanned energy photoelectron diffraction

Journal of Electron Spectroscopy and Related Phenomena

Volumn 114-116, Issue , 2001, Pages 451-454

  Ishii, Hideshi ^a   Shiraki, Susumu ^a   Omori, Shinji ^a   Matsubayashi, Nobuyuki ^b   Imamura, Motoyasu ^b   Shimada, Hiromichi ^b   Nihei, Yoshimasa ^a  

^a INSTITUTE OF INDUSTRIAL SCIENCE   (Japan)

^b NATL INST OF MAT AND CHEM RES   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CALCIUM COMPOUNDS; ELECTRON DIFFRACTION; EPITAXIAL GROWTH; FILM GROWTH; SURFACE STRUCTURE; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

SCANNED ENERGY PHOTOELECTRON DIFFRACTION;

SEMICONDUCTING FILMS;

EID: 0035278383     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0368-2048(00)00400-X     Document Type: Article

References (9)

1. Saiki K., Sato Y., Ando K., Koma A. Surf. Sci. 192:1987;1.
2. Chambers S.A. Adv. Phys. 40:1991;357.
3. Egelhoff W.F. Jr. Bland J.A.C., Heinrich B. Ultrathin Magnetic Structure. Vol. 1:1994;220 Springer, Berlin.
4. Akita C., Tomioka T., Owari M., Mizuike A., Nihei Y. Jpn. J. Appl. Phys. 29:1990;2106.
5. Ishii H., Tanigawa S., Shiraki S., et al. J. Electron Spectrosc. Relat. Phenom. 88-91:1998;545.
6. Shimada H., Matsubayashi N., Imamura M. Rev. Sci. Instrum. 66:1995;1780.
7. Matsubayshi N., Shimada H., Tanaka K., Sato T., Yoshimura Y., Nishijima A. Rev. Sci. Instrum. 63:1992;1363.
8. Matsubayshi N., Kojima I., Kurahashi M., Nishijima A., Itoh A., Utaka T. Rev. Sci. Instrum. 60:1989;2533.
9. MSCD Photoelectron diffraction program package, as: Y. Chen, M.A. Van Howe, http://electron.lbl.gov/mscdpack/.