Simulation of interaction force between Si tip and Si(1 1 1)√3 × √3-Ag surface of IET structure in noncontact AFM

Surface Science

Volumn 493, Issue 1-3, 2001, Pages 188-193

  Sasaki, Naruo ^a,b   Watanabe, Satoshi ^a,b   Aizawa, Hideaki ^c   Tsukada, Masaru ^a  

^a UNIVERSITY OF TOKYO   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^c NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

Atomic force microscopy; Density functional calculations; Silicon; Silver

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRONIC STRUCTURE; SCANNING TUNNELING MICROSCOPY; SILVER; TEMPERATURE; THERMAL EFFECTS;

INEQUIVALENT-TRIMER (IET) STRUCTURES;

SEMICONDUCTING SILICON;

EID: 0035500860     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(01)01215-8     Document Type: Conference Paper

References (12)