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Volumn 81, Issue 22, 2002, Pages 4266-4268

Nitrogen passivation of deposited oxides on n 4H-SiC

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FIELD EFFECTS; PASSIVATION; SILICON CARBIDE; SURFACE CHEMISTRY;

EID: 0037175891     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1525058     Document Type: Article
Times cited : (24)

References (20)
  • 19
    • 0012034763 scopus 로고    scopus 로고
    • Ph.D. dissertation, Vanderbilt University
    • K. McDonald, Ph.D. dissertation, Vanderbilt University, 2001.
    • (2001)
    • McDonald, K.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.