-
1
-
-
0035328412
-
-
jjb JAPNDE 0021-4922
-
S.-i. Nagahama, T. Yanamoto, M. Sano, and T. Mukai, Jpn. J. Appl. Phys., Part 1 40, 3075 (2001). jjb JAPNDE 0021-4922
-
(2001)
Jpn. J. Appl. Phys., Part 1
, vol.40
, pp. 3075
-
-
Nagahama, S.-I.1
Yanamoto, T.2
Sano, M.3
Mukai, T.4
-
2
-
-
0031120767
-
-
apl APPLAB 0003-6951
-
J. M. Van Hove, R. Hickman, J. J. Klaassen, and P. P. Chow, Appl. Phys. Lett. 70, 2282 (1997). apl APPLAB 0003-6951
-
(1997)
Appl. Phys. Lett.
, vol.70
, pp. 2282
-
-
Van Hove, J.M.1
Hickman, R.2
Klaassen, J.J.3
Chow, P.P.4
-
3
-
-
0031551223
-
-
ell ELLEAK 0013-5194
-
P. M. Asbeck, E. T. Yu, S. S. Lau, G. J. Sullivan, J. Van Hove, and J. Redwing, Electron. Lett. 33, 1230 (1997). ell ELLEAK 0013-5194
-
(1997)
Electron. Lett.
, vol.33
, pp. 1230
-
-
Asbeck, P.M.1
Yu, E.T.2
Lau, S.S.3
Sullivan, G.J.4
Van Hove, J.5
Redwing, J.6
-
4
-
-
0000542663
-
-
apl APPLAB 0003-6951
-
E. T. Yu, X. Z. Dang, L. S. Yu, D. Qiao, P. M. Asbeck, S. S. Lau, G. J. Sullivan, K. S. Boutros, and J. M. Redwing, Appl. Phys. Lett. 73, 1880 (1998). apl APPLAB 0003-6951
-
(1998)
Appl. Phys. Lett.
, vol.73
, pp. 1880
-
-
Yu, E.T.1
Dang, X.Z.2
Yu, L.S.3
Qiao, D.4
Asbeck, P.M.5
Lau, S.S.6
Sullivan, G.J.7
Boutros, K.S.8
Redwing, J.M.9
-
5
-
-
5844371832
-
-
jva JVTAD6 0734-2101
-
J. R. Mileham, S. J. Pearton, C. R. Abernathy, J. D. MacKenzie, R. J. Shul, and S. P. Kilcoyne, J. Vac. Sci. Technol. A 14, 836 (1996). jva JVTAD6 0734-2101
-
(1996)
J. Vac. Sci. Technol. A
, vol.14
, pp. 836
-
-
Mileham, J.R.1
Pearton, S.J.2
Abernathy, C.R.3
MacKenzie, J.D.4
Shul, R.J.5
Kilcoyne, S.P.6
-
8
-
-
0032540476
-
-
sci SCIEAS 0036-8075
-
O. Khaselev and J. A. Turner, Science 280, 425 (1998). sci SCIEAS 0036-8075
-
(1998)
Science
, vol.280
, pp. 425
-
-
Khaselev, O.1
Turner, J.A.2
-
10
-
-
0001371153
-
-
apl APPLAB 0003-6951
-
C. Wetzel, T. Takeuchi, S. Yamaguchi, H. Katoh, H. Amano, and I. Akasaki, Appl. Phys. Lett. 73, 1994 (1998). apl APPLAB 0003-6951
-
(1998)
Appl. Phys. Lett.
, vol.73
, pp. 1994
-
-
Wetzel, C.1
Takeuchi, T.2
Yamaguchi, S.3
Katoh, H.4
Amano, H.5
Akasaki, I.6
-
11
-
-
0001539372
-
-
apl APPLAB 0003-6951
-
C. A. Parker, J. C. Roberts, S. M. Bedair, M. J. Reed, S. X. Liu, N. A. Masry, and L. H. Robbins, Appl. Phys. Lett. 75, 2566 (1999). apl APPLAB 0003-6951
-
(1999)
Appl. Phys. Lett.
, vol.75
, pp. 2566
-
-
Parker, C.A.1
Roberts, J.C.2
Bedair, S.M.3
Reed, M.J.4
Liu, S.X.5
Masry, N.A.6
Robbins, L.H.7
-
12
-
-
0031072477
-
-
jjc JAPLD8 0021-4922
-
T. Takeuchi, H. Takeuchi, S. Sota, H. Sakai, H. Amano, and I. Akasaki, Jpn. J. Appl. Phys., Part 2 36, L177 (1997). jjc JAPLD8 0021-4922
-
(1997)
Jpn. J. Appl. Phys., Part 2
, vol.36
, pp. 177
-
-
Takeuchi, T.1
Takeuchi, H.2
Sota, S.3
Sakai, H.4
Amano, H.5
Akasaki, I.6
-
14
-
-
0002128809
-
-
edited by J. H. Edgar (Electronic Material Information Service, London)
-
I. Akasaki and H. Amano, in Properties of Group III Nitrides, edited by J. H. Edgar (Electronic Material Information Service, London, 1994), pp. 30-34.
-
(1994)
Properties of GrouIII Nitrides
, pp. 30-34
-
-
Akasaki, I.1
Amano, H.2
-
16
-
-
0001778434
-
-
edited by J. H. Edgar (Electronic Material Information Service, London)
-
T. L. Tansley, in Properties of Group III Nitrides, edited by J. H. Edgar (Electronic Material Information Service, London, 1994), pp. 35-40.
-
(1994)
Properties of GrouIII Nitrides
, pp. 35-40
-
-
Tansley, T.L.1
-
19
-
-
84861431464
-
-
JCPDS-International Centre for Diffraction Data, File No. 02-1450, ICDD, Newton Square, PA
-
JCPDS-International Centre for Diffraction Data, File No. 02-1450, ICDD, Newton Square, PA.
-
-
-
-
20
-
-
0002806345
-
-
phr PHRVAO 0031-899X
-
W. W. Gärtner, Phys. Rev. 116, 84 (1959). phr PHRVAO 0031-899X
-
(1959)
Phys. Rev.
, vol.116
, pp. 84
-
-
Gärtner, W.W.1
-
21
-
-
0020132647
-
-
tsf THSFAP 0040-6090
-
Y. Mirovsky, R. Tenne, G. Hodes, and D. Cahen, Thin Solid Films 91, 349 (1982). tsf THSFAP 0040-6090
-
(1982)
Thin Solid Films
, vol.91
, pp. 349
-
-
Mirovsky, Y.1
Tenne, R.2
Hodes, G.3
Cahen, D.4
-
22
-
-
0020152874
-
-
jes JESOAN 0013-4651
-
R. Tenne, Y. Mirovsky, Y. Greenstein, and D. Cahen, J. Electrochem. Soc. 129, 1506 (1982). jes JESOAN 0013-4651
-
(1982)
J. Electrochem. Soc.
, vol.129
, pp. 1506
-
-
Tenne, R.1
Mirovsky, Y.2
Greenstein, Y.3
Cahen, D.4
-
23
-
-
0001538311
-
-
jaJAPIAU 0021-8979
-
J.-L. Reverchon, F. Huet, M.-A. Poisson, and J. Yves Duboz, J. Appl. Phys. 88, 5138 (2000). jap JAPIAU 0021-8979
-
(2000)
J. Appl. Phys.
, vol.88
, pp. 5138
-
-
Reverchon, J.-L.1
Huet, F.2
Poisson, M.-A.3
Duboz, J.Y.4
-
24
-
-
0242548817
-
-
edited by J. H. Edgar (Electronic Material Information Service, London)
-
J. A. Miragliotta, in Properties of Group III Nitrides, edited by J. H. Edgar (Electronic Material Information Service, London, 1994), pp. 190-194.
-
(1994)
Properties of GrouIII Nitrides
, pp. 190-194
-
-
Miragliotta, J.A.1
-
26
-
-
0001172399
-
-
apl APPLAB 0003-6951
-
R. W. Martin, P. G. Middleton, K. P. O'Donnel, and W. Van der Stricht, Appl. Phys. Lett. 74, 263 (1999). apl APPLAB 0003-6951
-
(1999)
Appl. Phys. Lett.
, vol.74
, pp. 263
-
-
Martin, R.W.1
Middleton, P.G.2
O'Donnel, K.P.3
Van Der Stricht, W.4
-
27
-
-
0033528895
-
-
msb MSBTEK 0921-5107
-
K. P. O'Donnel, R. W. Martin, P. G. Middleton, S. C. Bayliss, I. Fletcher, W. Van der Stricht, P. Demeester, and I. Moerman, Mater. Sci. Eng., B 59, 288 (1999). msb MSBTEK 0921-5107
-
(1999)
Mater. Sci. Eng., B
, vol.59
, pp. 288
-
-
O'Donnel, K.P.1
Martin, R.W.2
Middleton, P.G.3
Bayliss, S.C.4
Fletcher, I.5
Van Der Stricht, W.6
Demeester, P.7
Moerman, I.8
-
28
-
-
0001401146
-
-
apl APPLAB 0003-6951
-
M. D. McCluskey, C. G. Van de Walle, C. P. Master, L. T. Romano, and N. M. Johnson, Appl. Phys. Lett. 72, 2725 (1998). apl APPLAB 0003-6951
-
(1998)
Appl. Phys. Lett.
, vol.72
, pp. 2725
-
-
McCluskey, M.D.1
Van De Walle, C.G.2
Master, C.P.3
Romano, L.T.4
Johnson, N.M.5
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