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Journal of Chemical Physics

Volumn 116, Issue 14, 2002, Pages 6322-6328

Soft x-ray imaging and spectroscopy of single nanocrystals

(5) Rockenberger, Jörg a,b Nolting, Frithjof b,c Lüning, Jan c Hu, Jiangtao a,b Alivisatos, A Paul a,b

a UNIVERSITY OF CALIFORNIA (United States)

b LAWRENCE BERKELEY NATIONAL LABORATORY (United States)

c SLAC NATIONAL ACCELERATOR LABORATORY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROSCOPY; CRYSTAL STRUCTURE; ELECTRON ENERGY LEVELS; ETCHING; IRON OXIDES; PARTICLE SIZE ANALYSIS; SCANNING ELECTRON MICROSCOPY; SILICON WAFERS; SINGLE CRYSTALS; SURFACE ACTIVE AGENTS; TRANSMISSION ELECTRON MICROSCOPY; X RAY PHOTOELECTRON SPECTROSCOPY;

ENERGY RESOLUTION; HEXADECYLAMINE; HIGHLY ORIENTED PYROLYTIC GRAPHITE; MAGHEMITE; PHOTOEMISSION ELECTRON MICROSCOPY; SPECTRAL RESOLUTION; SPHERICAL GRATING MONOCHROMATOR; X RAY IMAGING; X RAY SPECTROMICROSCOPY;

NANOSTRUCTURED MATERIALS;

EID: 0037041680 PISSN: 00219606 EISSN: None Source Type: Journal
DOI: 10.1063/1.1460856 Document Type: Article

Times cited : (21)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.