Soft X-ray spectromicroscopy development for materials science at the Advanced Light Source

Journal of Electron Spectroscopy and Related Phenomena

Volumn 84, Issue 1-3, 1997, Pages 85-98

  Warwick, Tony ^a   Ade, Harald ^b   Hitchcock, Adam P ^c   Padmore, Howard ^a   Rightor, Ed G ^d   Tonner, Brian P ^e  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^b NORTH CAROLINA STATE UNIVERSITY   (United States)

^c MCMASTER UNIVERSITY   (Canada)

^d Dow Texas Polymer Center   (United States)

^e UNIVERSITY OF WISCONSIN MILWAUKEE   (United States)

Author keywords

Soft X ray spectromicroscopy; Synchrotron radiation

Indexed keywords

EID: 0347877208     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0368-2048(97)00026-1     Document Type: Article

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