SCOPUS 정보 검색 플랫폼

Volumn 7, Issue 4, 2000, Pages 475-494

Electron energy loss spectroscopy and annular dark field imaging at a nanometer resolution in a scanning transmission electron microscope

(8) Stephan O a Gloter, A a Imhoff, D a Kociak, M a Mory, C a Suenaga, K a,b Tence M a Colliex, C a,c

a UNIVERSITÉ PARIS SUD (France)

b MEIJO UNIVERSITY (Japan)

c LABORATOIRE AIMÉ COTTON (France)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON ENERGY LOSS SPECTROSCOPY; IMAGING SYSTEM; INFORMATION PROCESSING; INSTRUMENTATION; REVIEW; SCANNING TRANSMISSION ELECTRON MICROSCOPY;

EID: 0034495132 PISSN: 0218625X EISSN: None Source Type: Journal
DOI: 10.1016/S0218-625X(00)00042-7 Document Type: Review

Times cited : (12)

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