Circuit modeling of the LM124 operational amplifier for analog single-event transient analysis

IEEE Transactions on Nuclear Science

Volumn 49 I, Issue 6, 2002, Pages 3090-3096

  Boulghassoul, Y ^a   Massengill, L W ^a   Sternberg, Andrew L ^a   Pease, Ronald L ^b   Buchner, S ^c   Howard, J W ^d   McMorrow, D ^e   Savage, M W ^f   Poivey, C ^g  

^a VANDERBILT UNIVERSITY   (United States)

^b RLP Research   (United States)

^c QSS   (United States)

^d Jackson and Tull   (United States)

^e NAVAL RESEARCH LABORATORY   (United States)

^f NAVSEA   (United States)

^g NASA HEADQUARTERS   (United States)

Author keywords

Analog single event transients; Circuit modeling; Electrical calibration; Laser calibration; LM124 operational amplitier; Transistor parameter extraction

Indexed keywords

COMPUTER SIMULATION; INTEGRATED CIRCUIT LAYOUT; LASER BEAMS; LASERS; TRANSISTORS;

ANALOG SINGLE EVENT TRANSIENTS (ASET);

AMPLIFIERS (ELECTRONIC);

EID: 0036950063     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2002.805400     Document Type: Conference Paper

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