Analysis of single-event transients in analog circuits

IEEE Transactions on Nuclear Science

Volumn 47, Issue 6 III, 2000, Pages 2616-2623

  Adell, P ^a   Schrimpf, R D ^a   Barnaby, H J ^a   Marec, R ^b   Chatry, C ^c   Calvel, P ^b   Barillot, C ^b   Mion, O ^b  

^a VANDERBILT UNIVERSITY   (United States)

^b THALES ALENIA SPACE   (France)

^c Tests and Radiation   (France)

Author keywords

[No Author keywords available]

Indexed keywords

AMPLIFIERS (ELECTRONIC); COMPUTER SIMULATION; LINEAR INTEGRATED CIRCUITS; MATHEMATICAL MODELS; TRANSIENTS; VOLTAGE REGULATORS;

ANALOG CIRCUITS; SINGLE EVENT TRANSIENTS;

LINEAR NETWORK ANALYSIS;

EID: 0034450421     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.903817     Document Type: Conference Paper

References (8)

1. Single-event effects in analog and mixed-signal integrated circuits
2. Observation of heavy ion induced transients in linear circuits
3. Observation of single event upsets in analog microcircuits
4. Single event upset (SEU) sensitivity dependence of linear integrated circuits (ICs) on bias conditions
5. Ion track shunt effects in multi-junction structures
6. Charge deposition modeling of thermal neutron products in fast submicron MOS devices
7. Alcatel: C.chatry, TRAD, R. Ecoffet, Centre National d'Etudes Spatiales