The role of parasitic elements in the single-event transient response of linear circuits

IEEE Transactions on Nuclear Science

Volumn 49 I, Issue 6, 2002, Pages 3115-3120

  Sternberg, Andrew L ^a   Massengill, L W ^a   Buchner, S ^b   Pease, R L ^c   Boulghassoul, Y ^a   Savage, M W ^d   McMorrow, D ^e   Weller, R A ^a  

^a VANDERBILT UNIVERSITY   (United States)

^b QSS GROUP INC   (United States)

^c RLP Research   (United States)

^d NAVAL SURFACE WARFARE CENTER   (United States)

^e NAVAL RESEARCH LABORATORY   (United States)

Author keywords

Analog; Comparator; Op amp; Single event; Spice

Indexed keywords

COMPARATOR CIRCUITS; COMPUTER SIMULATION; ELECTRIC RESISTANCE; LASER PULSES; OPERATIONAL AMPLIFIERS;

SINGLE EVENT TRANSIENTS (SET);

LINEAR NETWORKS;

EID: 0036954881     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2002.805340     Document Type: Conference Paper

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