Single event transient (SET) sensitivity of radiation hardened and COTS voltage comparators

IEEE Radiation Effects Data Workshop

Volumn , Issue , 2000, Pages 53-60

  Koga, R ^a   Crain, S H ^a   Crawford, K B ^a   Moss, S C ^a   LaLumondiere, S D ^a   Howard Jr , J W ^a  

^a AEROSPACE CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BIPOLAR TRANSISTORS; CMOS INTEGRATED CIRCUITS; COMPARATOR CIRCUITS; INTEGRATED CIRCUIT TESTING; MICROELECTRONICS; RADIATION EFFECTS; SILICON ON INSULATOR TECHNOLOGY; SILICON WAFERS; TRANSIENTS;

COMMERCIAL-OFF-THE-SHELF; DEVICE UNDER TEST; LINEAR MICROCIRCUITS; SINGLE EVENT TRANSIENT; SINGLE EVENT UPSETS;

RADIATION HARDENING;

EID: 0034512957     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (7)