Laser-induced nanoparticle ordering

Journal of Materials Research

Volumn 17, Issue 11, 2002, Pages 2815-2822

  Pedraza, A J ^a   Fowlkes, J D ^a   Blom, D A ^b   Meyer III, H M ^b  

^a University of Tennessee   (United States)

^b OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; AUGER ELECTRON SPECTROSCOPY; COMPOSITION EFFECTS; CRYSTAL MICROSTRUCTURE; DEPOSITION; DIFFRACTION GRATINGS; HIGH RESOLUTION ELECTRON MICROSCOPY; IRRADIATION; PULSED LASER APPLICATIONS; SCANNING ELECTRON MICROSCOPY; SILICON;

AUGER EMISSION SPECTROSCOPY; HIGH RESOLUTION SCANNING ELECTRON MICROSCOPY; LASER INDUCED PERIODIC SURFACE STRUCTURES; NANOPARTICLES; NORMAL BEAM INCIDENCE; PULSED LASER IRRADIATION; REDEPOSITION;

NANOSTRUCTURED MATERIALS;

EID: 0036866655     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/JMR.2002.0409     Document Type: Article

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