Low frequency current noise in unstressed/stressed thin oxide metal-oxide-semiconductor capacitors

Solid-State Electronics

Volumn 46, Issue 11, 2002, Pages 1807-1813

  Crupi, F ^a   Iannaccone, G ^b   Ciofi, C ^a   Neri, B ^b   Lombardo, S ^c   Pace, C ^a  

^a INFM   (Italy)

^b UNIVERSITY OF PISA   (Italy)

^c CNR IMETEM   (Italy)

Author keywords

MOS devices; Noise; Quantum point contact; Tunneling current

Indexed keywords

CAPACITORS; ELECTRIC CURRENTS; ELECTRON TRAPS; ELECTRON TUNNELING; QUANTUM ELECTRONICS; SPURIOUS SIGNAL NOISE; STRESSES; THIN FILMS;

CURRENT NOISE;

MOS DEVICES;

EID: 0036839424     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1101(02)00153-3     Document Type: Conference Paper

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