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Volumn 77, Issue 18, 2000, Pages 2876-2878

Suppressed shot noise in trap-assisted tunneling of metal-oxide-semiconductor capacitors

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0001497315     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1321735     Document Type: Article
Times cited : (24)

References (15)
  • 1
    • 0000018822 scopus 로고    scopus 로고
    • edited by L. L. Sohn, L. P. Kouwenhoven, and G. Schön Kluwer, Amsterdam
    • For a review on the subject, see M. J. M. De Jong and C. W. J. Beenakker, in Mesoscopic Electron Transport, edited by L. L. Sohn, L. P. Kouwenhoven, and G. Schön (Kluwer, Amsterdam, 1997), pp. 225, 258.
    • (1997) Mesoscopic Electron Transport , pp. 225
    • De Jong, M.J.M.1    Beenakker, C.W.J.2
  • 8
    • 0033080327 scopus 로고    scopus 로고
    • S. Takagi, N. Yasuda, and A. Toriumi, IEEE Trans. Electron Devices 46, 335 (1999); 46, 348 (1999).
    • (1999) IEEE Trans. Electron Devices , vol.46 , pp. 348


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.