Interconnect design for deep submicron ICs

IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers

Volumn , Issue , 1997, Pages 478-485

  Cong, Jason ^a   Pan, Zhigang ^a   He, Lei ^a   Koh, Cheng Kok ^a   Khoo, Kei Yong ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

OPTIMIZATION; RELIABILITY; SEMICONDUCTOR DEVICE MODELS;

INTERCONNECT DESIGN;

INTEGRATED CIRCUIT TESTING;

EID: 0031358448     PISSN: 10923152     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/iccad.1997.643579     Document Type: Conference Paper

References (40)