Implications of imperfect interfaces and edges in ultra-small MOSFET characteristics

Physica Status Solidi (B) Basic Research

Volumn 233, Issue 1, 2002, Pages 101-112

  Asenov, A ^a   Kaya, S ^b   Brown, A R ^a  

^a UNIVERSITY OF GLASGOW   (United Kingdom)

^b US Institute of Navigation   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0036733899     PISSN: 03701972     EISSN: None     Source Type: Journal    
DOI: 10.1002/1521-3951(200209)233:1<101::AID-PSSB101>3.0.CO;2-M     Document Type: Conference Paper

References (17)

1. Miniaturization of electronics and its limits