Nanoscale phenomena in synthetic functional oxide heterostructures

Microscopy and Microanalysis

Volumn 8, Issue 4, 2002, Pages 333-349

  Nagarajan, V ^a   Ganpule, C S ^a   Stanishevsky, A ^a   Liu, B T ^a   Ramesh, R ^a  

^a UNIVERSITY OF MARYLAND   (United States)

Author keywords

AFM; Ferroelectric; Nanoscale; Oxide thin films; Piezoelectric

Indexed keywords

EID: 0036689259     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/s1431927602020287     Document Type: Conference Paper

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