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Volumn 194, Issue 1, 2002, Pages 15-25

Accurate determination of the stopping power of 4He in Si using Bayesian inference

Author keywords

Electronic stopping; MCMC; Reference materials; Silicon

Indexed keywords

ENERGY DISSIPATION; ION BEAMS; ION IMPLANTATION; IONS; MARKOV PROCESSES; MONTE CARLO METHODS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SILICON;

EID: 0036644498     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(02)00494-9     Document Type: Article
Times cited : (38)

References (44)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.