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Volumn 152, Issue 2, 1999, Pages 370-376

Improved stoichiometry measurements using 4He elastic backscattering: experiment and simulation

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS SILICON; COMPUTER SIMULATION; HELIUM; ION BEAMS; SILICA; SILICON NITRIDE; STOICHIOMETRY;

EID: 0032680156     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(99)00180-9     Document Type: Article
Times cited : (20)

References (33)
  • 11
    • 85031635318 scopus 로고    scopus 로고
    • private communication
    • M. Bianconi, private communication, 1998.
    • (1998)
    • Bianconi, M.1
  • 30
    • 85031630519 scopus 로고    scopus 로고
    • private communication
    • I. Vickridge, private communication, 1998.
    • (1998)
    • Vickridge, I.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.