Test data compression and decompression based on internal scan chains and Golomb coding

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volumn 21, Issue 6, 2002, Pages 715-722

  Chandra, Anshuman ^a   Chakrabarty, Krishnendu ^a  

^a Duke University   (United States)

Author keywords

Automatic test equipment (ATE); Decompression architecture; Embedded core testing; Precomputed test sets; Response vectors; System on a chip testing; Test set encoding; Testing time; Variable to variable length codes

Indexed keywords

AUTOMATIC TESTING; DECODING; EMBEDDED SYSTEMS; ENCODING (SYMBOLS); MICROPROCESSOR CHIPS; VECTORS;

AUTOMATIC TEST EQUIPMENT (ATE);

DATA COMPRESSION;

EID: 0036608490     PISSN: 02780070     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCAD.2002.1004315     Document Type: Article

References (14)

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