Deterministic built-in test with neighborhood pattern generator

IEICE Transactions on Information and Systems

Volumn E85-D, Issue 5, 2002, Pages 874-883

  Nakao, Michinobu ^a,b   Kiyoshige, Yoshikazu ^a   Natsume, Koichiro ^a   Hatayama, Kazumi ^a   Fukumoto, Satoshi ^b   Iwasaki, Kazuhiko ^b  

^a HITACHI LTD   (Japan)

^b TOKYO METROPOLITAN UNIVERSITY   (Japan)

Author keywords

BIST; Bit flipping; Reseeding; Seed generation; Test pattern generator

Indexed keywords

COMPUTER HARDWARE; DATA STORAGE EQUIPMENT; ROM; SHIFT REGISTERS;

AUTOMATIC TEST PATTERN GENERATION; HAMMING DISTANCE; LINEAR FEEDBACK SHIFT REGISTER; NEIGHBORHOOD PATTERN GENERATOR;

BUILT-IN SELF TEST;

EID: 0036579504     PISSN: 09168532     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (21)

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