Nanostructural conductivity and surface-potential study of low-field-emission carbon films with conductive scanning probe microscopy

Applied Physics Letters

Volumn 75, Issue 22, 1999, Pages 3527-3529

  Zhang, L ^a   Sakai, T ^a   Sakuma, N ^a   Ono, T ^a   Nakayama, K ^a  

^a TOSHIBA CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001551753     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.125377     Document Type: Article

References (12)

1. N. S. Xu, Y. Tzeng, and R. V. Lantham, J. Phys. D 27, 1988 (1994).
2. W. Zhu, G. P. Kochanski, S. Jin, and L. Seibles, J. Appl. Phys. 78, 2707 (1995).
3. W. P. Kang, A. Wisitsora-at, J. L. Davidson, D. V. Kerns, Q. Li, J. F. Xu, and C. K. Kim, J. Vac. Sci. Technol. B 16, 684 (1998).
4. G. A. J. Amaratunga and S. R. P. Silva, Appl. Phys. Lett. 68, 2529 (1996).
5. A. Hart, B. S. Satyanarayana, W. I. Miline, and J. Robertson, Appl. Phys. Lett. 74, 1594 (1999).
6. M. W. Geis, J. C. Twichell, J. Macaulay, and K. Okano, Appl. Phys. Lett. 67, 1328 (1995).
7. N. A. Fox, W. N. Wang, T. J. Davis, J. W. Steeds, and P. W. May, Appl. Phys. Lett. 71, 2337 (1997).
8. A. T. Rakhimov, N. V. Suetin, E. S. Soldatov, M. A. Timofeyev, A. S. Trifonov, and V. V. Khanin, presented at 11th IVMC'98, 1998, p. 225.
9. O. Groning, O. M. Kuttel, P. Groning, and L. Schlapbach, Appl. Surf. Sci. 111, 135 (1997).
10. M. Nonnenmacher, M. P. O'Boyle, and H. K. Wickramasinghe, Appl. Phys. Lett. 58, 2921 (1991).
11. I. Gouzman, I. Lior, and A. Hoffman, Appl. Phys. Lett. 72, 296 (1998).
12. L. Zhang, T. Sakai, N. Sakuma, T. Ono, and K. Nakayama, New Diamond Front. Carbon Technol. 9, 53 (1999).