Two-dimensional test data compression for scan-based deterministic BIST

Journal of Electronic Testing: Theory and Applications (JETTA)

Volumn 18, Issue 2, 2002, Pages 159-170

  Liang, Hua Guo ^a   Hellebrand, Sybille ^b   Wunderlich, Hans Joachim ^a  

^a UNIVERSITY OF STUTTGART   (Germany)

^b UNIVERSITY OF INNSBRUCK   (Austria)

Author keywords

BIST; Deterministic BIST; Store and generate schemes; Test data compression

Indexed keywords

ANALOG STORAGE; AUTOMATIC TESTING; DATA COMPRESSION; FEEDBACK; INTEGRATED CIRCUITS;

DETERMINISTIC BUILT-IN SELF TEST;

BUILT-IN SELF TEST;

EID: 0036535203     PISSN: 09238174     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1014993509806     Document Type: Conference Paper

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