Using BIST control for pattern generation

IEEE International Test Conference (TC)

Volumn , Issue , 1997, Pages 347-355

  Kiefer, Gundolf ^a   Wunderlich, Hans Joachim ^a  

^a UNIVERSITY OF STUTTGART   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER HARDWARE; COUNTING CIRCUITS;

BUILT IN SELF TEST (BIST); PATTERN COUNTERS;

INTEGRATED CIRCUIT TESTING;

EID: 0031340064     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (30)