Built-in self testing of high-performance circuits using twisted-ring counters

Proceedings - IEEE International Symposium on Circuits and Systems

Volumn 1, Issue , 2000, Pages I-72-I-75

  Chakrabarty, Krishnendu ^a   Swaminathan, Shivakumar ^a  

^a USA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BUILT-IN SELF TEST; ELECTRIC NETWORK ANALYSIS; ELECTRIC NETWORK SYNTHESIS; INTEGRATED CIRCUIT TESTING;

HIGH-PERFORMANCE CIRCUITS; TWISTED-RING COUNTERS;

MICROPROCESSOR CHIPS;

EID: 0033685326     PISSN: 02714310     EISSN: None     Source Type: Journal    
DOI: 10.1109/ISCAS.2000.857029     Document Type: Article

References (10)

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