On the use of counters for reproducing deterministic test sets

IEEE Transactions on Computers

Volumn 45, Issue 12, 1996, Pages 1405-1419

  Kagaris, Dimitrios ^a,b   Tragoudas, Spyros ^a,b   Majumdar, Amitava ^a,c  

^a IEEE

^b Southern Illinois University Carbondale   (United States)

^c Sunrise Test Systems Inc   (United States)

Author keywords

Binary counter; Binary matrix column permutations; Built in self test; Deterministic test set; Test pattern generation

Indexed keywords

EID: 0000845618     PISSN: 00189340     EISSN: None     Source Type: Journal    
DOI: 10.1109/12.545970     Document Type: Article

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