High-precision assessment of interface lattice offset by quantitative HRTEM

Journal of Microscopy

Volumn 194, Issue 1, 1999, Pages 142-151

  Schweinfest, R ^a   Ernst, F ^a   Wagner, T ^a   Ruhle M ^a  

^a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

Author keywords

Aluminium; Interface lattice offset; Interfaces; Quantitative highresolution transmission electron microscopy; Spinel; Translation state

Indexed keywords

ALUMINUM COMPOUNDS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; INTERFACE STATES; MAGNESIUM COMPOUNDS;

HIGH-PRECISION; HIGH-RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; INTERFACE LATTICE OFFSET; PRECISION ASSESSMENT; QUANTITATIVE EVALUATION; QUANTITATIVE HIGHRESOLUTION TRANSMISSION ELECTRON MICROSCOPY; RIGID BODY; SPINEL; TRANSLATION STATE; TRANSMISSION ELECTRON MICROSCOPY IMAGES;

ALUMINUM;

ARTICLE; CRYSTAL; IMAGE ANALYSIS; IMAGE PROCESSING; MATHEMATICAL ANALYSIS; PRIORITY JOURNAL; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0032965643     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.1365-2818.1999.00465.x     Document Type: Article

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