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Volumn 16, Issue 3, 2000, Pages 1415-1423

Determination of the inelastic mean free path of electrons in different polyaniline samples

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON ENERGY LEVELS; ELECTRON SCATTERING; ELECTRON SPECTROSCOPY; ELECTRON TRANSPORT PROPERTIES; INFRARED SPECTROSCOPY; SURFACE STRUCTURE; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0034620468     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la990699q     Document Type: Article
Times cited : (48)

References (55)
  • 22
    • 0000428349 scopus 로고
    • ASTM Standard E673-93
    • ASTM: Philadelphia, PA, Vol. 3.06
    • ASTM Standard E673-93, Annual Book of ASTM Standards; ASTM: Philadelphia, PA, 1994; Vol. 3.06, p 739.
    • (1994) Annual Book of ASTM Standards , pp. 739
  • 45
    • 0028392755 scopus 로고
    • Arbuckle, G. A.; Buecheler, N. M.; Clark, C.; Wille, A. Synth. Met. 1994, 63, 35. Arbuckle, G. A.; Buecheler, N. M.; Hall, J. W.; Valenitine, K. G.; Lefrant, S.; Mevellec, J. Y.; Mulazzi, E. Synth. Met. 1996, 79, 183.
    • (1994) Synth. Met. , vol.63 , pp. 35
    • Arbuckle, G.A.1    Buecheler, N.M.2    Clark, C.3    Wille, A.4
  • 54
    • 0027642870 scopus 로고    scopus 로고
    • Private communication
    • Kwei, C. M.; Chen, Y. F.; Tung, C. J.; Wang, J. P. Surf. Sci. 1993, 293, 202. Chen, Y. F. Private communication.
    • Chen, Y.F.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.