Crystalline effects in elastic peak electron spectroscopy

Vacuum

Volumn 54, Issue 1-4, 1999, Pages 201-204

  Gergely, G ^a   Barna, A ^a   Sulyok, A ^a   Jardin, C ^b   Gruzza, B ^c   Bideux, L ^c   Robert, C ^c   Toth, J ^d   Varga, D ^d  

^a RESEARCH INSTITUTE FOR TECHNICAL PHYSICS AND MATERIALS SCIENCE   (Hungary)

^b UNIVERSITÉ LYON 1   (France)

^c CNRS   (France)

^d INSTITUTE OF NUCLEAR RESEARCH ATOMKI   (Hungary)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHIZATION; ARGON; CLEANING; COMPOSITION; ION BOMBARDMENT; LOW ENERGY ELECTRON DIFFRACTION; SEMICONDUCTOR MATERIALS; SPUTTER DEPOSITION; SURFACE STRUCTURE; SURFACE TREATMENT; X RAY PHOTOELECTRON SPECTROSCOPY;

CRYSTALLINE EFFECTS; ELASTIC PEAK ELECTRON SPECTROSCOPY; RENNINGER PLOTS;

ELECTRON SCATTERING;

EID: 0033154325     PISSN: 0042207X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0042-207X(98)00460-6     Document Type: Article

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