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Volumn 76, Issue 4, 1997, Pages 237-246

Characterizing dislocation structures in bulk fatigued copper single crystals using electron channelling contrast imaging (ECCI)

Author keywords

[No Author keywords available]

Indexed keywords

BACKSCATTERING; CRACKS; DISLOCATIONS (CRYSTALS); ELECTRON DIFFRACTION; ELECTRON SCATTERING; FATIGUE OF MATERIALS; SCANNING ELECTRON MICROSCOPY; SINGLE CRYSTALS; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0031258093     PISSN: 09500839     EISSN: 13623036     Source Type: Journal    
DOI: 10.1080/095008397178986     Document Type: Article
Times cited : (58)

References (19)
  • 6
    • 84915310975 scopus 로고
    • edited by J. T. Fong and R. J. Field (Philadelphia: American Society for Testing and Materials)
    • Hunsche, a., and Neumann, P., 1988, Special Technical Publication 924, Vol. 1, edited by J. T. Fong and R. J. Field (Philadelphia: American Society for Testing and Materials), p. 26.
    • (1988) Special Technical Publication 924 , vol.1 , pp. 26
    • Hunsche, A.1    Neumann, P.2
  • 13
    • 0004274342 scopus 로고
    • Cambridge: Cambridge University Press
    • Suresh, S., 1991, Fatigue of Materials (Cambridge: Cambridge University Press), p. 45.
    • (1991) Fatigue of Materials , pp. 45
    • Suresh, S.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.