Application of electron channelling contrast to the investigation of strain localization effects in cyclically deformed fcc crystals

Philosophical Magazine Letters

Volumn 74, Issue 6, 1996, Pages 449-454

  Schwab, A ^a   Bretschneider, J ^a   Buque, C ^a   Blochwitz, C ^a   Holste, C ^a  

^a DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON SCATTERING; NICKEL; SCANNING ELECTRON MICROSCOPY; SINGLE CRYSTALS;

ELECTRON CHANNELLING CONTRAST TECHNIQUE; FACE CENTERED CUBIC CRYSTALS; PERSISTENT SLIP BANDS; STRAIN LOCALIZATION EFFECTS;

DISLOCATIONS (CRYSTALS);

EID: 0030386291     PISSN: 09500839     EISSN: 13623036     Source Type: Journal    
DOI: 10.1080/095008396179986     Document Type: Article

References (8)

1. Basinski, Z. S., Korbel, A. S., and Basinski, S. J., 1980, Acta metall., 28, 191.
2. Basinski, Z. S., Pascual, R., and Basinski, S. J., 1983, Acta metall., 31, 591.
3. Blochwitz, C., and Veit, U., 1982, Cryst. res. Technol., 17, 529.
4. Holste, C., Bretschneider, J., and Hache, T., 1994, Strength of materials, Proceedings of the Tenth International Conference of the Strength of Materials, edited by H. Oikawa, K. Maruyama, S. Takeuchi and M. Yamaguchi (Sendai: Japan Institute of Metals), p. 477.
5. Mughrabi, H., 1981, Continuum Models of Discrete Systems 4, edited by O. Brulin and R. K. T. Hsieh. (Amsterdam: North-Holland), p. 241.
6. Mughrabi, H., Ackermann, F., and Herz, K., 1979, Fatigue Mechanisms, Proceedings of an ASTM-NBS-NSF Symposium, Kansas City, Missouri, May 1978, ASTM Special Technical Publication No. 675, edited by J. T. Fong (Philadelphia, Pennsylvania: American Society for Testing and Materials), p. 69.
7. Winter, A. T., 1974, Phil. Mag., 30, 719.
8. Zauter, R., Petry, F., Bayerlein, M., Sommer, C., Christ, H.-J., and Mughrabi, H., 1992, Phil. Mag., A, 66, 425.