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Volumn 37, Issue 6, 2000, Pages 301-314

Crystallographic fractometry: A new method of fracture surface analysis applied on TiAl fracture surfaces;Kristallographische Fraktometrie: Eine neue Methode zur Bruchflaechenanalyse angewandt auf TiAl-Bruchflaechen

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLOGRAPHIC FRACTOMETRY; TITANIUM ALUMINIDE; CRYSTALLOGRAPHIC ORIENTATIONS; FRACTOGRAPHIC FEATURES; FRACTURE SURFACE ANALYSIS; FRACTURE SURFACES; ORIENTATION MEASUREMENTS; STEREOPHOTOGRAMMETRY; SUBMICROMETERS; THREE-DIMENSIONAL RECONSTRUCTION;

EID: 0033688648     PISSN: 0032678X     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (4)

References (9)
  • 9
    • 0342914313 scopus 로고    scopus 로고
    • Crystallographic fractometry of TiAl fracture surfaces
    • M.W. Brown, E.R. de los Rios, K.J. Miller (Eds.), EMAS Publishing, Sheffield
    • Hebesberger, T.; et al.: Crystallographic fractometry of TiAl fracture surfaces, in: Proc. of ECF12, Vol.1, M.W. Brown, E.R. de los Rios, K.J. Miller (Eds.), EMAS Publishing, Sheffield, 1998
    • (1998) Proc. of ECF12 , vol.1
    • Hebesberger, T.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.