On applying non-classical defect models to automated diagnosis

IEEE International Test Conference (TC)

Volumn , Issue , 1998, Pages 748-757

  Saxena, Jayashree ^a   Butler, Kenneth M ^a   Balachandran, Hari ^a   Lavo, David B ^a   Chess, Brian ^a   Larrabee, Tracy ^a   Ferguson, F Joel ^a  

^a TEXAS INSTRUMENTS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

APPLICATION SPECIFIC INTEGRATED CIRCUITS; CRYSTAL DEFECTS; FAILURE ANALYSIS; ION BEAMS; MATHEMATICAL MODELS;

FOCUSED ION BEAMS (FIB);

INTEGRATED CIRCUIT TESTING;

EID: 0032320509     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (36)