Oxide VCSEL reliability qualification at Agilent Technologies

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4649, Issue , 2002, Pages 130-141

  Herrick, Robert W ^a  

^a AGILENT TECHNOLOGIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CAMERAS; ELECTRONICS PACKAGING; FAILURE ANALYSIS; THERMOCOUPLES; TRANSCEIVERS;

LASER DESIGN; VERTICAL CAVITY SURFACE EMITTING LASERS;

SEMICONDUCTOR LASERS;

EID: 0036408082     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.469227     Document Type: Conference Paper

References (19)

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2. R.W. Herrick, S.F. Lim, H. Deng, Q. Deng, J.J. Dudley, M.R. Keever, T. Oh, M.Y. Li, M. Tashima, L.A. Hodge, X. Zhang, J. Herniman, P. Evans, B. Liang, C. Lei, "Highly reliable oxide VCSELs manufactured at HP/Agilent Technologies, Proc. of SPIE, 3946, pp. 14-19, (2000).
3. Bobby Hawthorne, "Optoelectronic Reliability Study for 850nm implant VCSEL", dated Sept. 2001 available on web site at www.honeywell.com/sensing/VCSEL
4. Bobbt Hawthorne, "Oxide Isolated VCSEL Reliability Summary", dated April 2001, available on web site at www.honeywell.com/sensing/VCSEL/. See also papers by Honeywell in this volume, and in ECTC 2002 proceedings.
5. David J. Bossert, Doug Collins, I. Aeby, J. Bridget Clevenger, Chris Helms, Welin Luo, Charlie X. Wang, Hong Q. Hou, "Production of high-speed oxide confined VCSEL arrays for datacom applications," in this volume, Proc of SPIE, vol. 4649, paper 22a, (2002).
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18. R.W. Herrick, Ph.D. Dissertation, Chapter 5
19. R.W. Herrick, Y.M. Cheng, P.M. Petroff, and others, "Analysis of VCSEL degradation modes," Proc of the SPIE, vol. 2683, pp. 123-133, (1996).