Highly reliable oxide VCSELs manufactured at HP/Agilent Technologies

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3946, Issue , 2000, Pages 14-19

  Herrick, R W ^a   Lim, S F ^a   Deng, H ^a   Deng, Q ^a   Dudley, J J ^a   Keever, M R ^a   Oh, T ^a   Li, M ^a   Tashima, M ^a   Hodge, L A ^a   Zhang, X ^a   Herniman, J ^a   Evans, P ^a   Liang, B ^a   Lei, C ^a  

^a HEWLETT PACKARD COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEGRADATION; FIBER OPTIC NETWORKS; MATHEMATICAL MODELS; OPTICAL COMMUNICATION; RELIABILITY;

OXIDE APERTURES; VERTICAL CAVITY SURFACE EMITTING LASERS (VCSEL);

SEMICONDUCTOR LASERS;

EID: 0033686536     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (12)