Analysis of VCSEL degradation modes

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2683, Issue , 1996, Pages 123-133

  Herrick, Robert W ^a   Cheng, Y Michael ^a   Beck, James M ^b   Petroff, Pierre M ^a   Scott, Jeff W ^a   Peters, Matthew G ^a   Robinson, Gerald D ^a   Coldren, Larry A ^a   Morgan, Robert A ^c   Hibbs Brenner, Mary K ^c  

^a University of California   (United States)

^b Apprentice Research at QUEST

^c HONEYWELL TECHNOLOGY CENTER   (United States)

Author keywords

Cathodoluminescence; Dark line defects; DBRs; Distributed bragg reflectors; Electroluminescence; Laser degradation; Laser reliability; VCSELs

Indexed keywords

CATHODOLUMINESCENCE; CHIP SCALE PACKAGES; DBR LASERS; DEFECTS; DISTRIBUTED BRAGG REFLECTORS; ELECTROLUMINESCENCE; GALLIUM ARSENIDE; III-V SEMICONDUCTORS; LASER MIRRORS; LIGHT; REFLECTION; RELIABILITY; SEMICONDUCTING INDIUM GALLIUM ARSENIDE; SEMICONDUCTOR LASERS;

DARK-LINES; DBRS; DEGRADATION PROCESS; DESIGN IMPROVEMENTS; LASER DEGRADATION; LASER RELIABILITY; MINORITY CARRIER INJECTION; PARALLEL COMMUNICATION LINKS;

SURFACE EMITTING LASERS;

EID: 0003074228     PISSN: 0277786X     EISSN: 1996756X     Source Type: Conference Proceeding    
DOI: 10.1117/12.237683     Document Type: Conference Paper

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