Degradation mechanisms of vertical cavity surface emitting lasers

Annual Proceedings - Reliability Physics (Symposium)

Volumn , Issue , 1996, Pages 211-213

  Cheng, Y Michael ^a   Herrick, Robert W ^a   Petroff, Pierre M ^a   Hibbs Brenner, Mary K ^a   Morgan, Robert A ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CATHODOLUMINESCENCE; DEFECTS; DEGRADATION; FAILURE ANALYSIS; PROTONS; RELIABILITY; SEMICONDUCTOR DEVICE STRUCTURES; STATISTICAL TESTS; TRANSMISSION ELECTRON MICROSCOPY;

DEFECT STRUCTURES; PROTON IMPLANTED VERTICAL CAVITY SURFACE EMITTING LASERS;

SEMICONDUCTOR LASERS;

EID: 0029700292     PISSN: 00999512     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/relphy.1996.492121     Document Type: Conference Paper

References (8)