Reliability of vertical-cavity lasers at Hewlett Packard

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3627, Issue , 1999, Pages 48-55

  Herrick, R W ^a   Lei, C ^a   Keever, M R ^a   Lim, S F ^a   Deng, H ^a   Dudley, J J ^a   Bhagat, J K ^a  

^a HEWLETT PACKARD COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AGING OF MATERIALS; EQUIPMENT TESTING; HIGH TEMPERATURE EFFECTS; OXIDES; PROTONS; RELIABILITY; SERVICE LIFE;

LASER AGING; VERTICAL CAVITY SURFACE EMITTING LASERS;

SEMICONDUCTOR LASERS;

EID: 0032596963     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.347106     Document Type: Conference Paper

References (19)