SCOPUS 정보 검색 플랫폼

Materials Research Society Symposium - Proceedings

Volumn 688, Issue , 2002, Pages 343-350

Ferroelectric and displacement properties of lead zirconate titanate thick films prepared by chemical solution deposition process

(3) Iijima, Takashi a Hayashi, Yoshinori a Onagawa, Jun a

a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

COERCIVE FORCE; CRYSTAL MICROSTRUCTURE; CRYSTAL ORIENTATION; DEPOSITION; FERROELECTRICITY; FIRING (OF MATERIALS); PERMITTIVITY; POLARIZATION; PYROLYSIS; SPIN COATING; THICK FILMS; X RAY DIFFRACTION ANALYSIS;

CHEMICAL SOLUTION DEPOSITION; COERCIVE FIELD; DISPLACEMENT; DISSIPATION FACTOR; LEAD ZIRCONATE TITANATE; METHOXYETHANOL; REMNANT POLARIZATION; TITANIUM ISOPROPOXIDE; TRIHYDRATED LEAD ACETATE; ZIRCONIUM N-PROPOXIDE;

SEMICONDUCTING LEAD COMPOUNDS;

EID: 0036351573 PISSN: 02729172 EISSN: None Source Type: Journal
DOI: None Document Type: Article

Times cited : (6)

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