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Volumn 71, Issue 8, 2000, Pages 3118-3122

Method to produce high-resolution scanning near-field optical microscope probes by beveling optical fibers

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Indexed keywords


EID: 0001436481     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1304866     Document Type: Review
Times cited : (36)

References (22)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.