Characterizing the deformed state in Al-0.1 Mg alloy using high-resolution electron backscattered diffraction

Journal of Microscopy

Volumn 205, Issue 3, 2002, Pages 218-225

  Hurley, Peter J ^a   Humphreys, F J ^a  

^a UNIVERSITY OF MANCHESTER   (United Kingdom)

Author keywords

Absolute grain reconstruction; Angular resolution; Deformation; FEGSEM; Linear intercept; Microshear bands; Relative Euler contrast; Substructure; TEM

Indexed keywords

DATA HANDLING; ELECTRON DIFFRACTION; ELECTRONS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; MAGNESIUM ALLOYS;

ABSOLUTE GRAIN RECONSTRUCTION; ANGULAR RESOLUTION; ELECTRON BACK SCATTER DIFFRACTION; ELECTRON BACKSCATTER DIFFRACTION; FEG-SEM; LINEAR INTERCEPT; MICROSHEAR BAND; RELATIVE EULER CONTRAST; SUBSTRUCTURE; TEM;

SCANNING ELECTRON MICROSCOPY;

ALLOY; ALUMINUM; MAGNESIUM;

ACCURACY; ANALYTIC METHOD; ARTICLE; COMPARATIVE STUDY; DIFFRACTION; FIELD EMISSION; GRAIN; INFORMATION PROCESSING; LIGHT SCATTERING; MICROSCOPY; PRIORITY JOURNAL; QUANTITATIVE ANALYSIS; SCANNING ELECTRON MICROSCOPE; TECHNIQUE; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0036094589     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.1365-2818.2002.00997.x     Document Type: Article

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