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Crystal Research and Technology

Volumn 37, Issue 7, 2002, Pages 645-653

Grazing incidence in-plane diffraction measurement of in-plane mosaic with microfocus x-ray tubes

(2) Goorsky, M S a Tanner, B K b

a University of California (United States)

b DURHAM UNIVERSITY (United Kingdom)

Author keywords

Diffraction; X ray

Indexed keywords

CRYSTAL ORIENTATION; CRYSTALLOGRAPHY; LATTICE CONSTANTS; SIGNAL TO NOISE RATIO; X RAY SCATTERING;

BRAGG REFLECTIONS; GRAZING INCIDENCE IN-PLANE X-RAY DIFFRACTION; IN-PLANE MOSAIC STRUCTURE; X-RAY BEAMS;

SEMICONDUCTING GALLIUM COMPOUNDS;

EID: 0036069670 PISSN: 02321300 EISSN: None Source Type: Journal
DOI: 10.1002/1521-4079(200207)37:7<645::AID-CRAT645>3.0.CO;2-E Document Type: Article

Times cited : (9)

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