High-resolution x-ray diffraction studies of roughness and mosaic defects in epitaxial Fe/Au multilayers

Journal of Physics D: Applied Physics

Volumn 34, Issue 10 SPEC. ISS. A, 2001, Pages

  Fulthorpe, B D ^a,c   Ryan, P A ^b,d   Hase, T P A ^a   Tanner, B K ^a   Hickey, B J ^b  

^a DURHAM UNIVERSITY   (United Kingdom)

^b UNIVERSITY OF LEEDS   (United Kingdom)

^c Smiths Group plc   (United Kingdom)

^d Bede Scientific Instruments Ltd   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL DEFECTS; ROUGHNESS MEASUREMENT; X RAY DIFFRACTION ANALYSIS;

GRAZING INCIDENCE SCATTERING; MOSAIC DEFECTS;

MULTILAYERS;

EID: 0035926715     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/34/10a/342     Document Type: Article

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