High-resolution x-ray diffraction from epitaxial gallium nitride films

Materials Research Society Symposium - Proceedings

Volumn 449, Issue , 1997, Pages 483-488

  Lafford, T ^a   Loxley, N ^a   Tanner, B K ^a  

^a Bede Scientific Instruments Ltd   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EPITAXIAL GROWTH; NITRIDES; SEMICONDUCTING GALLIUM COMPOUNDS; SURFACE STRUCTURE; X RAY DIFFRACTION ANALYSIS;

GALLIUM NITRIDE; MOSAIC STRUCTURE;

SEMICONDUCTING FILMS;

EID: 0030679046     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (12)