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Volumn 34, Issue 10 SPEC. ISS. A, 2001, Pages

Strain analysis and quantum well intermixing of a laterally modulated multiquantum well system produced by focused ion beam implantation

Author keywords

[No Author keywords available]

Indexed keywords

INTERFACES (MATERIALS); ION BEAMS; ION IMPLANTATION; MULTILAYERS; RAPID THERMAL ANNEALING; STRAIN; X RAY DIFFRACTION;

FOCUSED ION BEAM IMPLANTATION; GRAZING INCIDENCE DIFFRACTION (GID); QUANTUM WELL INTERMIXING;

SEMICONDUCTOR QUANTUM WELLS;

EID: 0035926814 PISSN: 00223727 EISSN: None Source Type: Journal
DOI: 10.1088/0022-3727/34/10a/303 Document Type: Article

Times cited : (2)

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