Aging properties of 840 nm ion-implanted VCSEL's monitored by analysis of their photoelectric properties

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3946, Issue , 2000, Pages 30-35

  Tomm, J W ^a   Baerwolff, A ^a  

^a MAX BORN INSTITUT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

AGING OF MATERIALS; DEFECTS; ION IMPLANTATION; PHOTOCURRENTS; QUANTUM EFFICIENCY;

PHOTOCURRENT SPECTROSCOPY; VERTICAL CAVITY SURFACE EMITTING LASERS (VCSEL);

SEMICONDUCTOR LASERS;

EID: 0033704423     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)